Fig. 5: Microstructural analysis of the alloy inserted heterostructure.

a XRD patterns for W/W_100−xTa_x/CoFeB/MgO/Ta films and b W/W_100−xV_x/CoFeB/MgO/Ta films after annealing at 300 °C for 1 h. Reference peak positions for the α (ICDD No. 00-004-0806) and β (ICDD No. 00-047-1319) phases of W are denoted below.