Fig. 2: Characterization of the GeS microstructure.
From: In-plane optical and electrical anisotropy in low-symmetry layered GeS microribbons
a EDS spectrum obtained from a GeS microribbon; the inset images are elemental mapping of the grown GeS crystal. b SEM image of the GeS microribbons. c AFM image. The inset image is the height profile along the red line in the AFM image. d XRD pattern of the microribbons, which shows that the crystal structure is orthorhombic. e TEM image of a GeS microribbon. f The corresponding HRTEM image shown in e, and the inset image illustrates the corresponding SAED pattern.
