Fig. 1
From: Direction-specific interaction forces underlying zinc oxide crystal growth by oriented attachment
SEM and AFM images of a ZnO(0001) AFM tip. a Side view (scale bar 10 µm), the inset (scale bar 100 nm) is a high magnification image to show surface flatness; b Top view (scale bar 500 nm); c an AFM image of the ZnO tip surface, collected by reverse imaging using a whisker substrate (scale bar 25 nm); and d an EDX spectrum of the ZnO tip surface
