Fig. 7
From: Optical charge state control of spin defects in 4H-SiC
Spatial and amplitude control of the divacancy charge conversion. a Imaging sequence for b, c, with three sequential 2D sweeps: (1) Reset to high VV0 concentration using 405 nm. (2) Write using 976 nm with varying duration for charge conversion back to a desired lower VV0 concentration. (3) Read with a fast 976 nm pulse. b Pixel test of spatial control with, from left to right, the original pattern, the measured pattern in the X−Y plane (parallel to the sample surface) and the measured pattern in the X−Z plane (orthogonal to the sample surface). For X−Z, the intensity is normalized to the PL collection efficiency across the sample depth. Below each image, the corresponding cumulative distribution function (C.D.F.) is plotted from cumulative binning of the pixels according to their intensity (int.) and expected color (black/white dots for black/white pixels). The fidelity F is defined as \(1 - P\left( {{\rm{b}}\left| {\rm{w}} \right.} \right) - P\left( {{\rm{w}}\left| {\rm{b}} \right.} \right),\) where \(P\left( {i\left| j \right.} \right)\) is the probability of measuring i expecting j, where i, j = black (b), white (w), and the expected color is given by the background color in the plot50. c Amplitude control of the charge conversion using a gray scale image (left: original image, right: experiment)
