Fig. 5
From: Picometer polar atomic displacements in strontium titanate determined by resonant X-ray diffraction
Confidence intervals of the fitted displacement parameters. Correlations are illustrated by the dependence of the residual sum of squares χ2 on pairwise variation of the fit parameters (atomic displacements) during fit of the data shown in Fig. 4. The white cross indicates the global minimum. Confidence regions for 1σ, 2σ, and 3σ are marked by white contour lines following Avni et al.51. Regarding the layer thickness, only correlation with titanium displacement is shown. The uncertainty of the thickness parameter has a negligible effect on atomic displacements
