Table 1 Parameters and properties of seven devices

From: Long-distance propagation of short-wavelength spin waves

Device

Structure

Thickness (nm)

a (nm)

n

λ (nm)

s (μm)

η

A1

YIG/Ti/Co

20/1/25

200

2, 4

100

30

95%

A2

YIG/Ti/Co

20/1/25

180

2, 4, 6

60

30

106%

A3

YIG/Ti/Co

20/1/50

180

4

90

60

61%

A4

YIG/Al2O3/Co

20/7/30

600

14, 16

75

30

11%a

B1

YIG/Ti/Ni

20/2/20

600

4, 6, 8, 10

120

30

21%

C1

YIG/Ti/CoFe

20/1/50

200

2, 4, 6, 8

50

15

98%

C2

YIG/Al2O3/CoFe

20/25/50

200

2, 4

100

15

41%

  1. Notes: a is the nanowire array period; n is the index of the observed spin-wave mode; λ is the shortest spin-wave wavelength measured; and s is the distance between the two CPWs. η denotes the detected highest amplitude of the n = 4 spin-wave normalized by that of CPW-excited spin waves for an external field of 100 Oe
  2. aThis value is extracted for n = 14 mode, since the n = 4 mode is barely detectable for this sample
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