Fig. 3
From: In situ atomic-scale observation of oxidation and decomposition processes in nanocrystalline alloys
XRD, EDXS, APT and TEM characterizations of ex situ annealed samples. a Full range XRD profiles of 75Cu–25Fe samples ex situ annealed at different temperatures. b Fine scanning XRD profiles focusing on (111)fcc and (110)Fe peaks. c Lattice parameter and residual Fe concentration in fcc matrix of samples annealed at different temperatures. d APT overview image of the 75Cu–25Fe sample ex situ annealed at 300 °C and the corresponding oxygen map highlighting O-rich clusters. e HRTEM image of the sample ex situ annealed at 420 °C showing the neighboring Cu and Fe grains on zone axes of [011]Cu and [012]Fe, respectively. The two FFT images are calculated based on the Cu and Fe areas marked with white frames. f Low magnification BF image of the sample ex situ annealed at 420 °C; the white arrows indicate Fe grains. The inset at top-right corner is a grain size statistics histogram, and the bottom-right diffraction pattern is from the same annealed sample. The scale bar in (e) is 2 nm and in (f) is 100 nm
