Fig. 3
From: A silicon metal-oxide-semiconductor electron spin-orbit qubit
Measurement time dependence. a Long-time (50 min) averaged measurements of singlet return signal as a function of manipulation time for several magnetic field strengths aligned along the \([1\bar 10]\) crystallographic direction. The data for each field has been shifted for clarity. b The extracted \(T_{\mathrm{2}}^ \star\) as a function of total experimental measurement time. (inset) Magnetic noise creates fluctuations in the effective magnetic field at each QD, leading to variation in the X-rotation frequency throughout the measurement. c Relevant time scales of the measurement. The shortest time scale susceptible to noise in the experiment is the time spent manipulating the qubit. In the limit of quasi-static noise, we expect the qubit to have a constant environment during this time. However, over the course of a total pulse cycle (which consists of qubit preparation and measurement and may be several ms in length), the environment may change. Furthermore, as the cycle is repeated and averaged by the lock-in for each data point, each data point is collected for a free induction decay curve. As successive curves are averaged together, the distribution of noise that is sampled grows larger. d During the course of the measurement, the qubit is susceptible to noise in the frequency band between 1/tTotal and 1/tManipulation
