Fig. 5
From: Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices
Field intensity recovery for a 1 × 2 MMI. We considered here a MMI device with length L = 31.875 μm and width W = 6.0 μm, and covered by a silica cladding. a Simulated field intensity map for excitation by the input waveguide fundamental mode. b Perturbation maps predicted with our model for the coupling between the fundamental mode of the input waveguide and the fundamental mode of the pair of output waveguides, and measured experimentally by combining the two MMI outputs using a reverse 2 × 1 MMI splitter
