Table 1 Cryo-EM data collection and modeling statistics

From: Sub-2 Å Ewald curvature corrected structure of an AAV2 capsid variant

EM data collection/processing

AAV2L336C

Microscope

FEI Titan Krios

Voltage (kV)

300

Camera

Gatan K2 Summit

Nominal defocus range (μm)

0.6–2

Defocus mean ± std (μm)

1.1 ± 0.6

Exposure time (s)

3.5

Dose rate (e pixel−1 s−1)

4

Total dose (e Å−2)

22.5

Pixel size (Å)

0.788

Number of micrographs

1317

Number of particles (processed)

78,194

Number of particles (in final map)

30,515

Symmetry

I

Resolution limit during final refinement (Å)

1.90

Resolution (global) (Å)a

1.86

Local resolution range

1.78–1.92

Directional resolution range

1.86–1.86

Sphericity of 3DFSC

1

Map sharpeningb

Spectral flattening between 8 and 1.8 Å, using pre-cut-off b-factor of −90 and post-cut-off b-factor of 0

Model statistics

AAV2L336C

Residue range

226–735

Map Cross Correlation

0.849

Root Mean Square Deviation RMSD [bonds] (Å)

0.01

Root Mean Square Deviation RMSD [angles] (Å)

0.93

All-atom clashscore

7.97

Ramachandran plot

 

 Favored (%)

97.2

 Allowed (%)

2.8

 Outliers

0

Rotamer outliers

0

C-β deviations

0

EM-Ringer score

8.23

Average b-factor

16.1

  1. aResolution assessment based on frequency-limited refinement using the 0.143 threshold for resolution analysis61
  2. bMap sharpening based on cisTEM whitening and sharpening algorithm23