Fig. 2

Angle- and polarization-dependent X-ray absorption spectroscopy. a Schematics of the measurement geometries where θ is the angle between the polarization vector E of the incoming X-rays (blue arrows) and the principal crystallographic axes as labeled. Experimental (solid points) and calculated (lines) show the polarization dependence of the Fe-L₂-peak ratio as a function of θ for incident X-rays along the [110] (green lines), [001] (red lines), and \(\left[ {1\overline 1 0} \right]\) (blue lines) of b 12 nm and c 70 nm thick films on GdScO₃ (010)_O, and d 12 nm and e 70 nm thick films on SrTiO₃ (110). Insets of (b–e) show the schematics of the strain states and the orientation of L (red arrow)