Fig. 2
From: Spectral field mapping in plasmonic nanostructures with nanometer resolution
EELS and IMT measurements. a HAADF image (black and white) and overall loss probability (color overlay), b subset of inelastic EFDPs with indicated centers-of-mass, and c experimental (solid line) and simulated (dashed line) overall EEL spectra with employed energy slit indicated. The beam positions are indicated with respect to the Al rod. Note that an effective dielectric screening (see Methods), accounting for the aluminum oxide surface and the substrate, was necessary to shift the simulated peak to the experimentally observed value. The strong increase of the EEL spectra towards smaller losses are due to the monopole surface mode centered at approximately 0.7 eV
