Fig. 3
From: Excess charge-carrier induced instability of hybrid perovskites
Impact of excess free charge on stability of OIHP thin films and solar cells under illumination. a Photographs and b degradation percentage of the MAPbI3 films covered by PTAA, PCBM, and PS under illumination for different time. c The typical original J–V curve of devices for stability test. d The light stability of devices with load and in open circuit (OC) condition under continuous illumination, the error bar (±standard deviation) were calculated from 5 devices. e, f The typical light stability of degraded device at different conditions: with load, OC and short circuit (SC), under light and dark cycling
