Fig. 1

Inclusions analysed in situ by Secondary Ion Mass Spectrometry (SIMS). a Plane-polarised light photomicrograph of an olivine-hosted melt inclusions with exsolved bubbles. b Reflected light photomicrograph of homogeneous, rounded monosulphide solid solution (mss) sulphides of pyrrhotite composition hosted in a clinopyroxene phenocryst (group 1a). c Sub-angular sulphide inclusion with intergrowths of mss and intermediate solid solution (iss) (group 2), as well as small exsolutions of a Ni-rich phase at their interface (see elemental maps in Supplementary Fig. 3). Note the contact between the inclusion and silicate melt. d Irregular shaped inclusion of mss with interstitial oxide (group 2). e Group 2 zoned mss-iss sulphide surrounded by melt and a skeletal, rapidly growing spinel phenocryst. f Rounded sulphide droplet, with trellis texture and attached to the outside of an spinel phenocryst, also in contact with melt. Scale bars are 20 μm for panels a, c–e and 50 μm for panels b, f