Fig. 2
From: Single crystal hybrid perovskite field-effect transistors
Microstructure and surface properties of TSCs. a XRD data comparing the polycrystalline thin film (PTF) to the TSC and bulk single crystal (BSC) forms of MAPbBr3. Surface topography of a MAPbBr3 PTF (b) and that of a TSC (c) as measured by AFM, of which the root mean squared (RMS) roughness for PTF and TSC are 16.5 and 0.21 nm, respectively. Scale bar: 400 nm. d RMS surface roughness of MAPbX3 (X = Cl, Br, and I) polycrystalline film and TSCs. The error bar reflects the statistical variation in roughness in different parts of the sample. e Scanning tunneling microscopy (STM) image of the surface region near the edge of a MAPbBr3 TSC. Scale bar: 50 nm. f XPS spectra of the surface of MAPbI3 TSC and BSC
