Fig. 2
As-grown 2D p-MSB crystal. a Scanning electron microscope (SEM) image of a typical millimeter-sized 2D p-MSB crystal grown on SiO2/Si. b Transmission electron microscope (TEM) image and c, the selected-area electron diffraction (SAED) analysis of a 2D p-MSB crystal. d–f AFM images of monolayer (1 L), bilayer (2 L), and trilayer (3 L) p-MSB on SiO2/Si, respectively. The insets are the corresponding height profiles across the dashed white lines in d–f. g–i High-resolution atomic force microscope (AFM) images of the monolayer (2.2 nm), thin-film (20 nm), and bulk p-MSB crystals on SiO2/Si. The insets are the corresponding fast Fourier transforms (FFTs) of the high-resolution AFM images. j, k Grazing incident X-ray diffraction (GIXRD) patterns of the 2D p-MSB or bulk p-MSB film for (020) and (004) as a function of scattering vector (Q), measured at different incidence angles (α = 0.1° or 0.5°). The scale bars in a, b, d–f, g–h are 200 μm, 5 μm, 1 μm, and 10 nm, respectively
