Fig. 1
Characterizations of as-prepared sample. Rietveld refinements of a NFPP-E. Schematic representation of the refinement results is presented in the insets. b XPS spectra of C 1s and the corresponding deconvolution curves of both NFPP-E and NFPP-C samples. c Raman spectra of both samples in the Raman shift range from 100 cm−1 to 1800 cm−1. d SEM images of NFPP-E and e transmission electron microscope (TEM) image of NFPP-E particles. f Bright field (BF) image of NFPP-E with carbon layers. g HAADF image from aberration-corrected STEM and the crystal structure of NFPP-E viewed from the [010] direction. The insets are the corresponding signal responses along the selected lines. h The corresponding SAED pattern of NFPP-E and i atomic force microscopy (AFM) image of NFPP-E nanoplate particles and their corresponding heights. j The STEM-EDS mapping results for selected elements of NFPP-E. Scale bars: 500 nm (d); 200 nm (e); 5 nm (f); 1 nm (g); 2 1/nm (h); 200 nm (i); 100 nm (j)
