Fig. 2
From: Adhesion of two-dimensional titanium carbides (MXenes) and graphene to silicon
AFM line scans (a, b) and corresponding RMS values (c, d) for Ti3C2Tx and Ti2CTx films of different thicknesses. Horizontal dash lines in bottom panels represent the average RMS for Ti3C2Tx and Ti2CTx, which were used in adhesion energy calculations. Error bars represent standard deviations in RMS values
