Fig. 3
Influence of strains on morphology and electrical resistance of Pt films. a, b In-situ imaging of cracking process of Pt films coated on (a) a flat surface or (b) a nanowire-structured surface at different strains, respectively (two MVs and corresponding CMV are marked with yellow arrows or box; NV region and corresponding CNV are marked with greed dashed box; scale bar in a, 200 μm; scale bar in b, 20 μm; scale bar of enlarged figures of 0% and 115% strain in b, 5 μm). c, d Linear density and length of cracks of the Pt film coated on hierarchical assemblies of 4-μm-length nanowires plotted as a function of strains. Subscripts x and y represent the directions parallel and perpendicular to the stretch, respectively. Error bars, s.d. (n = 20). e Electrical resistance of the Pt film and calculated P (ρxlx / (l0-ρyly)) as a function of strains (see Supplementary Note 4 for details). f Tolerable strain as a function of nanowire length. Error bars, s.d. (n = 5)
