Fig. 4 | Nature Communications

Fig. 4

From: Selective crack suppression during deformation in metal films on polymer substrates using electron beam irradiation

Fig. 4

Fabrication and behavior of a strain-responsive OLED patterned by e-beam irradiation. a Schematic illustration showing the fabrication and test procedures of the strain-responsive OLED. A red star-shaped dot marked on the Cu film denotes the location of the positive bias. b Layer structure of the OLED. c–g Images of the OLED under a bias of 8 V at ε = (c) 0, (d) 4, (e) 5, (f) 6, and (g) 7%. Red and black arrows in a and d, respectively, denote the direction of the tensile strain. Scale bar, 500 μm

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