Fig. 7
∆p and ∆u vs. thickness of different fitting approaches. The error bar in the x-axis represents the statistical standard deviation ±5 nm of the thickness determined by profilometer. The error bar in the y-axis represents the statistical standard deviation of the possible fitting values. a, b Reflection (R) mode thickness dependence of ∆p and ∆u. c, d Transmission (T) mode thickness dependence of ∆p and ∆u. Analytical ∆k + ∆n represents both the active layer’s electroabsorption and electrorefraction are considered. Analytical ∆k represents only the active layer’s electroabsorption signal is considered
