Fig. 2
From: Anomalous magnetoresistance due to longitudinal spin fluctuations in a Jeff = 1/2 Mott semiconductor
MR and XMCD measurements. (a) T-dependent MR under various in-plane (solid line) magnetic fields and a 14 T out-of-plane (dashed line) magnetic field. (b) In-plane uniform susceptibility χ extracted from the in-plane field-induced XMCD difference (Supplementary Fig. 3). The solid line is a guide to the eye. In-plane magnetic field dependences of MR (c) at various temperatures and XMCD (d) at 150 K. The error bars come from the statistical averaging every 0.5 T.
