Fig. 2
Synchrotron X-ray diffraction data. a Rietveld fit to high resolution synchrotron powder X-ray diffraction data (sample A) at 100 K using a single phase of CaFe3O5 in space group Cmcm. b (002) peaks of CaFe3O5 samples at 500 K and 100 K (offset in the y-axis by 30000 counts) showing no visible phase separation between these temperatures for sample A and a very slight degree of phase separation in the 100 K data for sample B, corresponding to the CA phase reported by Hong et al.13, which occurs at a much higher phase percentage (30–50%) in their sample. c Temperature dependence of the cell parameters across the Charge Ordering transition in sample A. Parameters were obtained by Rietveld refinement against diffraction patterns obtained on the I11 diffractometer (Diamond Light Source)22, collected continuously with the PSD detector while cooling the sample with a cryostream between 500 and 100 K.
