Fig. 3
From: Programming DNA origami patterning with non-canonical DNA-based metallization reactions
Characterization of DCIMP. a A small-sized digit 8 pattern enabling the measurement of line width and density. Scale bar: 25 nm. b Force-distance (FD) curve-based AFM (FD-based AFM) characterization of nanomechanical properties of metalized patterns. The error bars are the standard deviation for N = 25 and 25 samples with the origami and the metalized patterns, respectively. c Cu plating on a whole triangular origami with STEM and elemental mapping characterization. Scale bar: 50 nm. d Ag plating on a whole triangular origami with STEM and elemental mapping characterization. Scale bar: 50 nm.
