Fig. 2: Atomic-resolution STEM-EDX of SISF and SESF at 1 and 5% creep strains.
From: Unveiling the Re effect in Ni-based single crystal superalloys
1% crept specimen: a HRSTEM HAADF image showing the atomic structure of a SESF; b Cr EDS mapping for (a); c Co EDS mapping for (a); d HRSTEM HAADF image of a SISF; e Cr EDS mapping for (d); f Co EDS mapping for (d). 5% crept specimen: h STEM LAADF image showing a PD, a SISF and a SESF; i HRSTEM HAADF image showing the atomic structure of the SISF; j HRSTEM HAADF image showing the atomic structure of the SESF; k Cr EDS mapping for (h); l Co EDS mapping for (h); m Re EDS mapping for (h). Scale bar: 1 nm for (a–j); 5 nm for (k–m). The colour intensity from EDS mapping is related to the composition in at%. Here, EDS mapping is used to provide a qualitative assessment, and the quantitative assessment comes from the APT measurement shown below.
