Fig. 3: Correlative TEM/APT investigation showing a SF from the 1% crept sample.
From: Unveiling the Re effect in Ni-based single crystal superalloys
a TEM BF showing the contrast of a SF. b Corresponding APT reconstruction showing a γ/γ′ interface and a SF (highlighted by magenta, 3.4 at% Cr iso-composition surfaces) in the γ′. c SF viewed edge-on, indicating the SF is connecting with a trailing partial dislocation in the groove. Two arrows (blue: perpendicular to the SF plane and green: across γ/γ′ interface through the partial dislocation in the groove) show two directions of compositional analysis, the rectangle highlights the fault region. 1D compositional analysis as shown in the two directions: d along blue arrow: perpendicular to the fault plane, the light purple rectangle highlights the fault region, and e along green arrow: across γ/γ′ interface through the partial dislocation in the groove, and the light grey rectangle shows the γ/γ′ interface. f Cr atoms displaying γ & γ′ phases and the SF. g Co surface displaying γ & γ′ and the SF and h 2D projection in XZ and YZ plane highlighting the fault region. Size of region of interest: 24 × 12 × 100 nm3. Scale bar: a 500 nm; b, c 50 nm. The error bars in Fig. 3d, e are estimated as described in Methods section.
