Fig. 4: APT analysis for 5% creep specimen.
From: Unveiling the Re effect in Ni-based single crystal superalloys
a APT reconstruction showing two γ/γ′ interfaces and a SF in the γ‘ precipitate. The SF is connected with a PD. b A close-up of the fault region, highlighting with a 2D projection, showing depletion of Al in the fault region. c Top (viewed along Z-axis) and side view (viewed along X-axis) showing the distribution of Cr atoms from γ/γ′ interface to SF and PD. d Top (viewed along Z-axis) and side view (viewed along X-axis) showing the distribution of Re atoms from γ/γ′ interface to SF and PD. 1D compositional profile along Z showing the distribution of the elements perpendicular to PD (green rectangle) and perpendicular to SF plane (orange rectangle): e Ni and Al; f Cr and Co; g Re. Scale bar in (a): 20 nm. The error bars in (e–g) are estimated as described in Methods section.
