Fig. 6: Micrographs of fractured Ea. and Ta. spicules. | Nature Communications

Fig. 6: Micrographs of fractured Ea. and Ta. spicules.

From: Lamellar architectures in stiff biomaterials may not always be templates for enhancing toughness in composites

Fig. 6

Representative Ea. and Ta. spicules are shown in a and b, respectively. False color is used to mark important features. The purple region in both a and b corresponds to the coarse (higher current) FIB cut discussed in Section Spicule notching procedure. The red region in a and b corresponds to the fine (lower current) FIB cut. The blue regions correspond to debris that we assume collected on the fracture surfaces during specimen preparation. The red arrow denotes the direction of crack growth. The cusp feature in a and b is a feature of the three-point bending test configuration that appears for both the Ea. and Ta. spicules. In b, part of this feature is occluded by the adhesive used to mount the spicule to the aluminum stub. Scale bars are 10 μm.

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