Fig. 4: Polarization retention over a duration of >1 year showing no degradation over time in comparison to other ferroelectric systems. | Nature Communications

Fig. 4: Polarization retention over a duration of >1 year showing no degradation over time in comparison to other ferroelectric systems.

From: Superior polarization retention through engineered domain wall pinning

Fig. 4

a Out-of-plane PFM amplitude images of domains of different diameters recorded at the times indicated. The domains were fabricated by a tip voltage of −9 V with different pulse duration times (from right to left: 5 ms, 10 ms, 20 ms, 50 ms, 100 ms, and 200 ms). The needle-like rhombohedral variants are formed around the tetragonal domains concomitantly during the switching, as observed previously61. b Domains of various diameters and their change over time spanning 8904 h showing excellent polarization retention. The data are extracted from a and fitted by the modified 2D-Gaussian method. In another separately poled region, the domains poled with 300 ms at −9 V with a different tip display a no-decay trend of the polarization during the first 2000 h. The error bar shown here represents the standard error for each data point fitted by the modified 2D-Gaussian method. c A comparison of normalized retained polarization versus relaxation time between BiFeO3 thin film in this study and other ferroelectric materials in previous reports, showing superior retention performance. The solid blue data points show the retention behaviour in the preliminary 2100 h and the solid black data points show the retention behaviour over 8900 h. Please note that all the legends shown below the figures are for Fig. 4c.

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