Fig. 3: Two-component analysis of out-of-plane charge-density-wave (CDW) correlations.

a, b Raw diffraction intensities along (0, k, 1 ∕ 2) and (0, k, 1) for temperatures and magnetic fields as indicated. c Raw diffraction intensity profile along the (0, 4 − δb, ℓ) direction, fitted with two Gaussian functions on a linear background. The dark grey line is their sum. d, e Magnetic-field-dependent evolution of the respective correlation lengths for ℓ = 1 ∕ 2 and 1. The dashed lines and shaded area are guides to the eye. Error bars are standard deviations determined by counting statistics and Gaussian fits, respectively. Source data are provided as a Source Data file.