Fig. 3: Angle dependent MR of Sr3SnO taken at low temperatures.
From: Robust weak antilocalization due to spin-orbital entanglement in Dirac material Sr3SnO
The MR is normalized with resistance at zero magnetic field. a MR for 105-nm-thick film and b 50-nm-thick film for a wide-field range (B > 9 T). The inset in (a) shows the orientation of current (I) and magnetic field (B) with respect to thin film (shown as a slab). c Zoom-in of the low-field MR indicated with dashed square in (a). d The low-field MR for the 50-nm-thick film at 2 K. The inset of (d) shows MR at 0.42 K, in which the qualitative difference between the data for different angles remain unchanged compared with that of 2 K.
