Fig. 4: Chemical structural characterization of gersiloxenes.

a FTIR and b Raman spectra of gersiloxenes with different x values, GeH and Si6H3(OH)3. c–f XPS spectra of gersiloxenes (x = 0.1, 0.3, 0.5, 0.7, 0.9), GeH and Si6H3(OH)3. c XPS survey spectra. High-resolution XPS spectra of d Ge3d e Si2p, and f O1s. Oads represents the adsorbed O at vacancy sites. FTIR Fourier transform infrared, XPS X-ray photoelectron spectroscopy. Source data are provided as a Source Data file.