Fig. 2: Characterization of strain compensated perovskite thin films.
From: Regulating strain in perovskite thin films through charge-transport layers
a Temperature-dependent (100) d-spacing of PDCBT and perovskite films. XPS spectra of (b) Pb 4f, (c) O 1s and, (d) S 2p in the perovskite, perovskite/PDCBT, and PDCBT films. e Normalized PL spectra of perovskite films with PDCBT, P3HT and Spiro-OMeTAD from the ITO side. f The calculated net average stress in perovskites within structures consisting of ITO/TiO2/perovskite/PDCBT as a function of PDCBT spin-coating temperature. g XRD patterns of perovskite film, powder and perovskite/PDCBT films fabricated at different PDCBT spin-coating temperatures. h Magnified (100) diffraction peaks in the region indicated by the blue. i Measured strain in perovskite films coated with PDCBT HTLs at different spin-coating temperatures.
