Fig. 6: 3D FIB-SEM reconstruction of E. coli.

Automated FIB-SEM cross sectional analysis was performed on an E. coli cell a that was pinned between two nanopillars b, c. The focused ion beam produced 120 cross sections (30 nm each) that were imaged, and reconstructed in Avizo d, e. Analysis of E. coli cross section #30 showed that nanopillar 1 had forced E. coli into nanopillar 2, resulting in a 189 nm reduction in cell width f. While nanopillar 1 had induced significant envelope deformation, no evidence of envelope penetration was found, and the width of E. coli cell quickly restored to normal either side of the contact point, indicating that the cell had not lost turgor pressure g, h. FIB-SEM analysis was performed on four E. coli cells interacting with TiO2 nanopillars.