Fig. 7: 3D FIB-SEM reconstruction of S. aureus.

Automated FIB-SEM cross sectional analysis was performed on an S. aureus cell interacting with three nanopillars a, b. The focused ion beam produced 57 cross sections (30 nm each) that were imaged, and reconstructed in Avizo c. Analysis of S. aureus cross section #40 showed the tip of nanopillar 2 located ~50 nm into the cell, providing confirmation of cell wall and inner envelope penetration d, e. FIB-SEM analysis was performed on one S. aureus cell interacting with TiO2 nanopillars.