Fig. 3: Colossal flexoresistance effect in ultrathin STO.

a Current‒voltage (I–V) curves obtained by conductive AFM measurements in a 10-unit cell-thick STO film upon application of various tip loading forces F. Five representative curves are shown here. b Effective resistivity (ρeff) as a function of F. c ρeff as a function of the AFM-tip-induced strain gradient ∂ut/∂x3. Error bars denote standard deviations of the fitted resistivity. Source data are provided as a Source data file.