Fig. 4: The impact of molecular n-doping on morphology.

Atomic force microscopy (AFM) images showing the topography of (a) P-90:TBAF(0 mol%), (b) P-90:TBAF(10 mol%), (c) P-90:TBAF(40 mol%) and (d) P-90:TBAF(80 mol%) thin-films. Scale bars are 500 nm. e Surface height distribution histograms and surface roughness root mean square (RMS) values corresponding to the topography images in (a–d). All films were deposited onto 580 × 580 µm2 Au electrodes and had been submerged in electrolyte prior to the measurements.