Fig. 4: PFM and XMLD-PEEM images of BiFeO3 and Bi0.85La0.15FeO3 thin films. | Nature Communications

Fig. 4: PFM and XMLD-PEEM images of BiFeO3 and Bi0.85La0.15FeO3 thin films.

From: Manipulating magnetoelectric energy landscape in multiferroics

Fig. 4

a Schematic of the XMLD-PEEM experimental geometries used to probe the angle dependence (Φ), linear dichroism. Linear polarizations: α = 0°; Linear polarization p: α = 90°. b, c In-plane-PFM and XMLD-PEEM images of 80-nm-thick BiFeO3. d, e In-plane-PFM and XMLD-PEEM images of 20-nm-thick BiFeO3. f, g In-plane-PFM and XMLD-PEEM images of 80-nm-thick Bi0.85La0.15FeO3. The green/red boxes represent the positive/negative polarized domain I/II. h, i In-plane-PFM and XMLD-PEEM images of 20-nm-thick Bi0.85La0.15FeO3.

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