Fig. 1: Temperature-dependent resistivity.
From: Tunable resistivity exponents in the metallic phase of epitaxial nickelates
Temperature dependence of the sheet resistance (RS), both during cooling and heating for NNO thin films grown on a LAO and b STO substrates with different thickness. The inset shows the metal–insulator transition temperature (TMI) as a function of thickness. The TMI is extracted from the resistivity data during the cooling-down process. The resistivity as a function of temperature in the metallic phase of NNO thin films grown on c LAO and d STO substrates with different thickness. The thin solid lines are fits using Eq. (1).
