Fig. 3: Structural characterisation.
From: Tunable resistivity exponents in the metallic phase of epitaxial nickelates
X-ray diffraction patterns around the 002 reflection of NNO/LAO films (a), and around the 001 reflection of NNO/STO films (b) with different thicknesses. Reciprocal space map (RSM) around the (103)c diffraction peaks of c 5-nm, d 10-nm and e 40-nm NNO/LAO films, and f 10-nm, g 20-nm and h 40-nm NNO/STO films. The abscissa, Kperp, (ordinate, Kpar,) represents the in-plane (out-of-plane) component of the scattering vector. Both are normalised by 2k0 = 4π/λ. The red dashed lines are guides to the eyes showing the substrate in-plane lattice. The yellow stars signal the (103)c peak of bulk NNO.
