Fig. 4: Atomic image and strain in NNO/LAO.
From: Tunable resistivity exponents in the metallic phase of epitaxial nickelates
Cross-sectional HAADF-STEM image of NdNiO3 thin films grown on LaAlO3 substrates, for a 5-nm-thick film (a) and a 20-nm-thick film (c). The respective in-plane components of the strain tensor (εxx, colour scales) obtained from the STEM images by geometrical phase analysis (GPA) are shown in b and d. The red dashed lines surround the RP faults.
