Fig. 6: Oxygen vacancy indicators. | Nature Communications

Fig. 6: Oxygen vacancy indicators.

From: Tunable resistivity exponents in the metallic phase of epitaxial nickelates

Fig. 6

a Seebeck coefficients (S) measured on NNO films with thickness of 10 nm grown on LAO and STO substrates. b The unstrained film lattice parameter (a0) and c the reversed residual-resistivity ratio (ρ0/ρ300K) of NNO films grown on LAO and STO substrates with different thickness. The error bar was determined from the deviation of repeated measurements.

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