Fig. 5: Temperature resolution and sensitivity.
a ON-state and OFF-state thermal transition curves recorded by optical reflectivity in a 1-µm-wide area of the SCO-coated glass substrate for three close values of the applied electrical current (I = 3.5, 3.6, and 3.7 mA). b Fitted derivative curves (dR/dTb vs. Tb) showing a measurable temperature shift for the ON-states. These measurements demonstrate that surface temperature variations as small as 1 °C can be unambiguously determined. c Typical thermal evolution of ∆R/R (λ = 452 nm) measured on a glass substrate coated with a 200-nm-thick film of 1. d Thermal evolution of the corresponding thermoreflectance coefficient defined as κ = d(∆R/R)/dT. At the spin-transition temperature, the thermal sensitivity is found one order of magnitude larger compared to the ordinary thermoreflectance. Red solid lines correspond to the best fit to the data using a sigmoidal function.
