Fig. 3: Characterization of optimized gate sets.

The overall fidelity of a gate set consisting of 36 ns long π/2x and π/2y gates is determined using RB (red) after a specific calibration run. Each data point is an average over 50 randomly chosen sequences of the respective length, the error bars indicate the standard error of the mean. In order to determine incoherent gate leakage we supplement the standard protocol (red) by a variant, which omits the last inversion pulse (blue)28. Simultaneously fitting both curves yields \({\mathcal{F}}=99.50\pm 0.04 \%\) and a leakage rate \({\mathcal{L}}=0.13\pm 0.03 \%\). For this measurement, ΔBz was stabilized with a standard deviation of \({\sigma }_{\Delta {B}_{z}}=2\pi \cdot 2.8\ {\rm{MHz}}\). The exact fit model is given in Supplementary Note 18.