Fig. 3: Morphology, FTIR, and XPS characterization of the CDs@SiO2. | Nature Communications

Fig. 3: Morphology, FTIR, and XPS characterization of the CDs@SiO2.

From: Ultralong lifetime and efficient room temperature phosphorescent carbon dots through multi-confinement structure design

Fig. 3

a TEM and b HRTEM images of CDs@SiO2-600. c Size distribution histogram of the CDs in SiO2 matrix prepared at 600 °C. d FTIR spectrum and e XPS survey spectrum of CDs@SiO2-600. f–h High resolution XPS spectrum and fitting results of C 1s (f), O 1s (g), and Si 2p (h) in CDs@SiO2-600. i Schematic of the proposed structure of CDs@SiO2.

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