Fig. 3: Scanning electron microscopy (SEM) of Zr(NDI)∣TiO2@GaP.
SEM image showing octahedra typical of the PIZOF-type MOF. Corresponding characterization for Si substrates can be found in the Supplementary Information.
Fig. 3: Scanning electron microscopy (SEM) of Zr(NDI)∣TiO2@GaP. | Nature Communications
