Fig. 4: Stability of the electric-field-induced polarization switch over time.
From: In-situ monitoring of interface proximity effects in ultrathin ferroelectrics
a–d PFM out-of-plane (in-phase, main panel) and in-plane (quadrature, inset) data immediately after the poling (±4 V) and 48 h later for a, b competitive and c, d cooperative interface configurations. PTO films are 20 u. c. thick and scale bars are 1 μm.
