Fig. 1: Structural characterizations of single-site Bi3+ substituted BixIn2–xO3.

a Aberration-corrected STEM image of 1.0% BixIn2–xO3 nanocrystals. b Aberration-corrected STEM image of 5.0% BixIn2–xO3 nanocrystals. c EDS mapping profiles of 5.0% BixIn2–xO3 along the indicated red line. d PXRD patterns of BixIn2–xO3 nanocrystals and pristine In2O3. e Normalized Bi L3-edge XANES spectra of 1.0% and 5.0% BixIn2–xO3, as well as Bi foil and Bi2O3 references. f k3-Weighted Bi L3-edge Fourier-transform EXAFS spectra of 1.0% and 5.0% BixIn2–xO3, as well as Bi foil and Bi2O3 references.