Fig. 1: Ultra-sensitive resonance manipulation by laser exfoliating MoS₂ thin films.

a Schematic diagram of tightly focused laser beams for exfoliating multilayer MoS₂ integrated on the Au substrate with atomic thickness precisions. b Optical and the AFM images of a Tangram pattern printed by the facile laser writing method. c The calculated total interfacial phase shifts for a dielectric layer-Au configuration with variant complex refractive index overlaid with the complex refractive index diagram of MoS₂ (green), graphene (black), and Ge (blue). d The calculated reflectance spectra of the MoS₂ thin films on the Au substrate with different numbers of layers. e Microscopic image of the grating structure fabricated with a period of 1800 nm. f Surface corrugation curve of patterned nanometric gratings corresponding to the dotted line. g Reflectance amplitude modulations by such grating structures. h Diffraction image retrieved by using three beams at wavelengths of 450, 550, and 650 nm simultaneously.