Fig. 2: Determination of rhombohedral–tetragonal phase transition temperature (Trt) of nontextured and textured 0.19PIN–0.445PSN–0.365PT ceramics.

a–d The <002> X-ray diffractions as a function of temperature for nontextured and textured PIN–PSN–PT ceramics. The colors indicate the intensity of X-ray diffractions. e–h The temperature dependence of dielectric behavior at 1 kHz for PIN–PSN–PT ceramics.